Dong Ryeol Lee Group

Physics of Interface Charge and Spin Lab

“Physics of Interface Charge and Spin (PICAS) Lab”
  • Characterization of interfacial structures in soft- and hard-matter thin films/multilayers
       : x-ray reflectivity and diffuse scattering, and  grazing-incidence x-ray small-angle scattering (GISAXS) studies
  • Structurally and magnetically rough interfaces in magnetic thin films/multilayers
       : soft/hard x-ray resonant magnetic scattering (XRMS) studies
  • Grazing-incidence x-ray scattering/diffraction study of structural effect of organic (polymer) layers on device performance in organic electronics systems (OFET, OPV, OLED)    
  • Ultrafast time-resolved x-ray diffraction study of femotosecond-laser induced phonon propagation across heterostructure interfaces
  • Investigation of spintronic and advanced functional materials using overseas synchrotron facilities (해외방사광 가속기를 이용한 스핀트로닉스 및 첨단 기능성 물질 연구 지원 사업단 - 홈페이지)
Dong Ryeol Lee, Ph.D.
Department of Physics, Soongsil University
Seoul 156-743, Korea
Tel) +82-2-820-0401

  • Ph.D. in Physics, 1999: POSTECH(Pohang University of Science and Technology), Korea
     Thesis:  “Diffuse x-ray scattering and x-ray resonant magnetic scattering studies for interface structures and magnetic properties of multilayers
     Advisor: Professor Ki-Bong Lee
  • MS in Physics, 1995: POSTECH(Pohang Univ. of Science and Technology), Korea.
  • BS in Physics, 1993: Seoul National University, Korea.

Professional Experience
  • Professor : September 2008 – Present, 
       Department of Physics, Soongsil University, Korea

  • Research Scientist : February 2006 - August 2008
         X-ray Beamline Operation Group I (5A, MS-XRS),  at Pohang Light Source(PLS), Pohang  
         Accelerator Laboratory
, Korea

  • Assistant Physicist : June 2004 - February 2006
        Time-Resolved and Coherent X-ray Research Group (Sector 8, IMMY/XOR-CAT)
        at Advanced Photon Source(APS), Argonne National Laboratory, USA

  • Assistant Physicist : August 2002 - June 2004
       Polarization Studies Group (Sector 4, XOR-CAT) at APS, USA

  • Postdoctoral : August 1999 - August 2002
       Polarization Studies Group (Sector 4, XOR-CAT) at APS, USA


Ph.D. 1st year

전공 : 응집물질물리 / 연구실 : 베어드홀 328호 / 이메일 :


석박통합 4학기

전공 : 박막물리 / 연구실 : 베어드홀 328호 / 이메일 :


석사과정 3학기

전공 : 박막물리실험 / 연구실 : 베어드홀 328호 / 이메일 :



전공 : 고체분광학실험 / 연구실 : 베어드홀 328호 / 이메일 :



08/2018 Ph.D.



02/2019 Ph.D. 예정


Alumni, Post-Doctoral at 표준원

02/2018 Ph.D.


Alumni, DGIST Researcher

08/2015 Ph.D. 수료


Alumni, K-Mac

08/2011 M.S.



02/2011 M.S.



02/2016, M.S.

For a more updated list, please visit: Google Scholar or ORCID

Selected list

Significance of the gate voltage-dependent mobility in the electrical characterization of organic field effect transistors, J. B. Kim and D. R. Lee*, Appl. Phys. Lett. 112, 173301 (2018).

Structural Investigation of Cesium Lead Halide Perovskites for High-Efficiency Quantum Dot Light-Emitting Diodes, Q. V. Le, J. B. Kim, S. Y. Kim*, B. Lee*, D. R. Lee*, J. Phys. Chem. Lett. 8, 4140 (2017).

Combinatorial Study of Temperature-Dependent Nanostructure and Electrical Conduction of Polymer Semiconductors: Even Bimodal Orientation Can Enhance 3D Charge Transport, S.Park, M.H.Lee, K.S.Ahn, H.H.Choi, J.Shin, J.Xu, J.Mei, K.Cho, Z.Bao, D.R.Lee*, M.S.Kang*, D.H.Kim*, Adv. Funct. Mater. 26, 4627 (2016).

Asymmetric magnetic proximity effect in a Pd/Co/Pd trilayer system, D.-O.Kim, K.M.Song, Y.Choi, B.-C.Min, J.-S.Kim, J.W.Choi*, D.R.Lee*, Sci. Rep. 6, 25391 (2016).

Real-time x-ray scattering study of the initial growth of organic crystals on polymer brushes, S.Y.An, K.Ahn, D.Y.Kim, H.H.Lee, J.H.Cho, D.R.Lee*, J. Chem. Phys. 140, 154702 (2014)

Oxygen-vacancy-induced orbital reconstruction of Ti ions at the interface of LaAlO 3/SrTiO 3 heterostructures: A resonant soft-X-ray scattering study, J. Park, B.-G. Cho, K.D. Kim, J. Koo, H. Jang, K.-T. Ko, J.-H. Park, K.-B. Lee, J.-Y. Kim, D.R. Lee, C.A. Burns, S.S. A. Seo, H. N. Lee, Phys. Rev. Lett. 110, 017401 (2013).

Enhancing crystallinity of C60 layer by thickness-control of underneath pentacene layer for high mobility C60/pentancene ambipolar transistor, K. Ahn, J.B.Kim, H.Park, H.Kim, M.H.Lee, B.J.Kim, J.H.Cho, M.S.Kang, D.R.Lee*, Appl. Phys. Lett. 102, 043306 (2013)

Inducing vortex formation in multilayered circular dots using remanent curves, D.-O.Kim, D.R.Lee*, Y.Choi*, V. Metlushko, J.Park, J.-Y.Kim, K.B.Lee, Appl. Phys. Lett. 101, 192404 (2012)

Polymer Brush As a Facile Dielectric Surface Treatment for High-Performance, Stable, Soluble Acene-Based Transistors, K.Park, S.H.Park, E.Kim, S.Y.An, H.S.Lim, H.H.Lee, D.H.Kim, D.Y.Ryu, D.R.Lee*, J.H.Cho*, Chem. Mat. 22, 5377 (2010).

Quantifying interlayer exchange coupling via layer-resolved hysteresis loops in antiferromagnetically coupled manganite/nickelate superlattices, J.Park, D.R.Lee*, Y.Choi, J.W.Freeland, K.B.Lee, S.K.Sinha, K.R.Nikolaev, A.M.Goldman, Appl. Phys. Lett. 95, 102504 (2009)

Self-Affine Surfaces of Polymer Brushes, B.Akgun, D.R.Lee*, H.Kim, H.Zhang, O.Prucker, J.Wang, J.Ruhe, M.D.Foster, Macromolecules 40, 6361 (2007)

Real-Time Evolution of the Distribution of Nanoparticles in an Ultrathin-Polymer-Film-Based Waveguide, S.Narayanan, D.R.Lee, R.S.Guico, S.K.Sinha, J.Wang, Phys. Rev. Lett. 94, 145504 (2005)

X-ray scattering from free-standing polymer films with geometrically curved surfaces, D.R.Lee, K.Shin, O.H.Seeck, Hyunjung Kim, Y.S.Seo, M.Tolan, M.H.Rafilovich, J.Sokolov,S.K.Sinha, Phys. Rev. Lett. 90, 185503 (2003).

X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in mulitlayered systems I. Specular reflectivity, D.R.Lee, D.Haskel, Y.Choi, J.C.Lang, S.A.Stepanov, G.Srajer, S.K.Sinha, Phys. Rev. B 68, 224409(1-19) (2003).

X-ray resonant magnetic scattering from structurally and magnetically rough interfacesin multilayered systems II. Diffuse scattering, D.R.Lee, C.S.Nelson, J.C.Lang, C.T.Venkataraman, G.Srajer, R.M.Osgood III, S.K.Sinha, Phys. Rev. B 68, 224410(1-14) (2003).

Polarized neutron scattering from ordered magnetic domains on a mesoscopic permalloy antidot array, D. R. Lee, G. Srajer, M. R. Fitzsimmons, V. Metlushko, S. K. Sinha, Appl. Phys. Lett. 82, 82 (2003).

Nonspecular x-ray-reflectivity study of partially correlated interface roughness of a Mo/Si multilayer, D. R. Lee, Y. J. Park, D. Kim, Y. H. Jeong, K.-B. Lee, Phys. Rev. B 57, 8786 (1998).



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