Dong Ryeol Lee Group

X-ray Resonant Scattering Lab

“X-ray Resonant Scattering Lab”
  • Resonant elastic x-ray scattering (REXS) studies of chirality and 3D nano-morphology of polar/magnetic topologies in ferroelectric/ferromagnetic and multiferroic thin films.
  • Ultrafast time-resolved x-ray scattering studies of femtosecond-laser induced phonon effects on polar/magnetic topologies using FEL x-rays. 
  • Phase field simulation related to ultrafast dynamics on polar topologies 
  • Characterization of chemically/magnetically interfacial structures in soft-/hard-matter thin films/multilayers using x-ray (resonant magnetic) reflectivity and GISAXS.
About image
Dong Ryeol Lee, Ph.D.
Professor
Department of Physics, Soongsil University
Seoul 06978, Korea
Tel) +82-2-820-0401
Email: drlee@ssu.ac.kr

Education
  • Ph.D. in Physics, 1999: POSTECH(Pohang University of Science and Technology), Korea
     Thesis:  “Diffuse x-ray scattering and x-ray resonant magnetic scattering studies for interface structures and magnetic properties of multilayers
     Advisor: Professor Ki-Bong Lee
  • MS in Physics, 1995: POSTECH, Korea.
  • BS in Physics, 1993: Seoul National University, Korea.

Professional Experience
  • Professor : September 2008 – Present, 
       Department of Physics, Soongsil University, Korea

  • Research Scientist : February 2006 - August 2008
         X-ray Beamline Operation Group I (5A, MS-XRS),  at Pohang Light Source(PLS), Pohang Accelerator Laboratory, Korea

  • Assistant Physicist : August 2002 - February 2006
       Advanced Photon Source(APS), Argonne National Laboratory, USA

  • Postdoctoral : August 1999 - August 2002
       Polarization Studies Group (Sector 4, XOR-CAT) at APS, ANL, USA
Professor image

서일완

Researcher

fss77@ssu.ac.kr

김국태

Postdoc

kooktaekim@soongsil.ac.kr

기정연

Ph.D. student

차부현

Graduate student

chaboohyun@naver.com

박흥열

Undergraduate

안광석

Alumni (02/2020 Ph.D.)

ASM America

조혜린

Alumni (02/2020 M.S.)

숭실대 물리학과 박사과정

조원혁

Alumni (02/2019 Ph.D.)

European X-ray Free Electron Laser GmbH(Germany) wins1119@gmail.com

김종범

Alumni (08/2018 Ph.D.)

i3system(주)

김동옥

Alumni (02/2018 Ph.D.)

한국전력공사

김윤철

Alumni (02/2016, M.S.)

안승엽

Alumni (08/2011 M.S.)

김종대

Alumni (02/2011 M.S.)

김국태

Alumni (02/2023 Ph.D.)

Postdoc, Soongsil University

For a more updated list, please visit: Google Scholar or ORCID


Selected list


Structural Chirality of Polar Skyrmions Probed by Resonant Elastic X-Ray Scattering, M.R. McCarter, K.T. Kim, V.A. Stoica, S. Das, C. Klewe, E.P. Donoway, D.M. Burn, P. Shafer, F. Rodolakis, M.A.P. Gonçalves, F. Gómez-Ortiz, J. Íñiguez, P. García-Fernández, J. Junquera, S.W. Lovesey, G. van der Laan, S.Y. Park, J.W. Freeland, L.W. Martin, D.R. Lee*, and R. Ramesh, Phys. Rev. Lett. 129, 247601 (2022). (selected as Cover paper)


Chiral Structures of Electric Polarization Vectors Quantified by X-Ray Resonant Scattering, K.T. Kim, M.R. McCarter, V.A. Stoica, S. Das, C. Klewe, E.P. Donoway, D.M. Burn, P. Shafer, F. Rodolakis, M.A.P. Gonçalves, F. Gómez-Ortiz, J. Íñiguez, P. García-Fernández, J. Junquera, S. Susarla, S.W. Lovesey, G. van der Laan, S.Y. Park, L.W. Martin, J.W. Freeland, R. Ramesh, and D.R. Lee*, Nat Commun 13, 1769 (2022).


Probabilistic Parameter Estimation Using a Gaussian Mixture Density Network: Application to X-Ray Reflectivity Data Curve Fitting, K.T. Kim and D.R. Lee*, J Appl Crystallogr 54, (2021).


Structural Transition and Interdigitation of Alkyl Side Chains in the Conjugated Polymer Poly(3-Hexylthiophene) and Their Effects on the Device Performance of the Associated Organic Field-Effect Transistor, K.S. Ahn, H. Jo, J.B. Kim, I. Seo, H.H. Lee, and D.R. Lee, ACS Appl. Mater. Interfaces 12, 1142 (2020)


Structural Investigation of Cesium Lead Halide Perovskites for High-Efficiency Quantum Dot Light-Emitting Diodes, Q. V. Le, J. B. Kim, S. Y. Kim*, B. Lee*, D. R. Lee*, J. Phys. Chem. Lett. 8, 4140 (2017).


Combinatorial Study of Temperature-Dependent Nanostructure and Electrical Conduction of Polymer Semiconductors: Even Bimodal Orientation Can Enhance 3D Charge Transport, S.Park, M.H.Lee, K.S.Ahn, H.H.Choi, J.Shin, J.Xu, J.Mei, K.Cho, Z.Bao, D.R.Lee*, M.S.Kang*, D.H.Kim*, Adv. Funct. Mater. 26, 4627 (2016).


Asymmetric magnetic proximity effect in a Pd/Co/Pd trilayer system, D.-O.Kim, K.M.Song, Y.Choi, B.-C.Min, J.-S.Kim, J.W.Choi*, D.R.Lee*, Sci. Rep. 6, 25391 (2016).


Oxygen-vacancy-induced orbital reconstruction of Ti ions at the interface of LaAlO 3/SrTiO 3 heterostructures: A resonant soft-X-ray scattering study, J. Park, B.-G. Cho, K.D. Kim, J. Koo, H. Jang, K.-T. Ko, J.-H. Park, K.-B. Lee, J.-Y. Kim, D.R. Lee, C.A. Burns, S.S. A. Seo, H. N. Lee, Phys. Rev. Lett. 110, 017401 (2013).


Enhancing crystallinity of C60 layer by thickness-control of underneath pentacene layer for high mobility C60/pentancene ambipolar transistor, K. Ahn, J.B.Kim, H.Park, H.Kim, M.H.Lee, B.J.Kim, J.H.Cho, M.S.Kang, D.R.Lee*, Appl. Phys. Lett. 102, 043306 (2013)


The Dedicated High-Resolution Grazing-Incidence X-Ray Scattering Beamline 8-ID-E at the Advanced Photon Source. Z. Jiang, X. Li, J. Strzalka, M. Sprung, T. Sun, A.R. Sandy, S. Narayanan, D.R. Lee, and J. Wang, J Synchrotron Rad 19, 627 (2012).


A Polymer Brush Organic Interlayer Improves the Overlying Pentacene Nanostructure and Organic Field-Effect Transistor Performance. S.H. Park, H.S. Lee, J.-D. Kim, D.W. Breiby, E. Kim, Y.D. Park, D.Y. Ryu, D.R. Lee*, and J.H. Cho, J. Mater. Chem. 21, 15580 (2011)


Reduced Viscosity of the Free Surface in Entangled Polymer Melt Films.  T. Koga, C. Li, M.K. Endoh, J. Koo, M. Rafailovich, S. Narayanan, D.R. Lee, L.B. Lurio, and S.K. Sinha, Phys. Rev. Lett. 104, 066101 (2010)


Particle Dynamics in Polymer-Metal Nanocomposite Thin Films on Nanometer-Length Scales. S. Narayanan, D.R. Lee, A. Hagman, X. Li, and J. Wang, Phys. Rev. Lett. 98, 185506 (2007)

    

Real-Time Evolution of the Distribution of Nanoparticles in an Ultrathin-Polymer-Film-Based Waveguide, S.Narayanan, D.R.Lee, R.S.Guico, S.K.Sinha, J.Wang, Phys. Rev. Lett. 94, 145504 (2005)


X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in mulitlayered systems I. Specular reflectivity, D.R.Lee*, D.Haskel, Y.Choi, J.C.Lang, S.A.Stepanov, G.Srajer, S.K.Sinha, Phys. Rev. B 68, 224409(1-19) (2003).


X-ray resonant magnetic scattering from structurally and magnetically rough interfacesin multilayered systems II. Diffuse scattering, D.R.Lee*, C.S.Nelson, J.C.Lang, C.T.Venkataraman, G.Srajer, R.M.Osgood III, S.K.Sinha, Phys. Rev. B 68, 224410(1-14) (2003).

 

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